Local current measurements
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F13%3A00423743" target="_blank" >RIV/68378271:_____/13:00423743 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Local current measurements
Original language description
Two groups of techniques based on local current flow between probe and sample in a Scanning Probe Microscope (SPM) are reviewed. Scanning tunneling microscopy and spectroscopy (STM, STS) is typically used in ultrahigh vacuum conditions for measurements of very high resolution images of atomic lattices surface reconstructions. We discuss its basics and related modeling and data interpretation approaches. Conductive Atomic Force Microscopy (C-AFM) is more often used in ambient conditions, to map local electrical properties of samples and to estimate local sample resistance based material contrast maps. Tip-sample junction models and typical artifacts of C-AFM are discussed, being illustrated by measurements on semiconducting samples, like microcrystalline solar cells.
Czech name
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Czech description
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Classification
Type
C - Chapter in a specialist book
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LM2011026" target="_blank" >LM2011026: Laboratory of nanstructures and nanomaterials</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Book/collection name
Quantitative Data Processing in Scanning Probe Microscopy
ISBN
978-1-4557-3058-2
Number of pages of the result
25
Pages from-to
221-245
Number of pages of the book
320
Publisher name
Elsevier
Place of publication
Oxford
UT code for WoS chapter
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