Use of fibre interferometry for nanoscale surface measurements

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F19%3AN0000144" target="_blank" >RIV/00177016:_____/19:N0000144 - isvavai.cz</a>
Result on the web
<a href="https://nanocon2019.tanger.cz/cz/program-konference/342-posterova-sekce-e/" target="_blank" >https://nanocon2019.tanger.cz/cz/program-konference/342-posterova-sekce-e/</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Use of fibre interferometry for nanoscale surface measurements
Original language description
Poster presentation at the Nanocon 2019 conference. The conference took place from October 16 to 18 in Brno Optical pickup in SPM has several principial limitations, the biggest one is assumption that the deflection has a simple shape, corresponding to a static beam fixed in one point. This is not valid in some cases: - in nanoindentation where probe is pinned to the surface - in high-speed measurements, where higher modes are excited. A fibre interferometer can measure better the probe apex position, minimizing the above artefacts. However, still it can not determine the cantilever bending. Fibre interferometers can be packed to pick the cantilever deflection in multiple spots, opening novel measurement capabilities for mechanical properties measurements and in high-speed AFM.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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