All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Wide spectral range optical characterization of tantalum pentoxide (Ta2O5) films by the universal dispersion model

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F25%3AN0000121" target="_blank" >RIV/00177016:_____/25:N0000121 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216224:14310/25:00141079

  • Result on the web

    <a href="https://opg.optica.org/ome/fulltext.cfm?uri=ome-15-4-903" target="_blank" >https://opg.optica.org/ome/fulltext.cfm?uri=ome-15-4-903</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1364/OME.550708" target="_blank" >10.1364/OME.550708</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Wide spectral range optical characterization of tantalum pentoxide (Ta2O5) films by the universal dispersion model

  • Original language description

    This study presents a comprehensive optical characterization of tantalum pentoxide (Ta2O5) thin films across a wide spectral range, using a combination of ellipsometric and spectrophotometric data. The films prepared using e-beam evaporation, ranging in thickness from 20 to 250 nm, were analyzed using a complex structural model that integrates inhomogeneous layer profiles with three distinct phases, allowing for a more accurate representation of the material's optical properties. A universal dispersion model was employed to describe the optical constants, revealing the refractive index and extinction coefficient with exceptional precision. This work stands out due to the extensive spectral range covered-extending from the far infrared (400 mu m, 25 cm-1) to the vacuum ultraviolet (116 nm, 10.7 eV)-and the diverse array of instruments used, providing a level of detail and insight into Ta2O5's optical behavior that has not been achieved before. This novel approach offers significant advancements in understanding Ta2O5's optical characteristics, demonstrating its potential for advanced optical coatings and optoelectronic applications.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    <a href="/en/project/EI22_002%2F0000677" target="_blank" >EI22_002/0000677: Pokročilá optika pro aplikace ultrakrátkých laserových pulzů ve vlnové oblasti DUV, VIS a NIR</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Optical Materials Express

  • ISSN

    2159-3930

  • e-ISSN

  • Volume of the periodical

    15

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    17

  • Pages from-to

    903-919

  • UT code for WoS article

    001459720200003

  • EID of the result in the Scopus database