PWM-based far-field blooming mitigation in edge-emitting lasers

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11120%2F25%3A43928861" target="_blank" >RIV/00216208:11120/25:43928861 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1007/s11082-025-08472-x" target="_blank" >https://doi.org/10.1007/s11082-025-08472-x</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s11082-025-08472-x" target="_blank" >10.1007/s11082-025-08472-x</a>

Result language
angličtina
Original language name
PWM-based far-field blooming mitigation in edge-emitting lasers
Original language description
High-power edge-emitting lasers (EELs) are pivotal in various applications but often suffer from thermal lensing, leading to the far-field pattern (FFP) blooming. This study, focusing on illumination applications, explores pulse width modulation (PWM) output control to mitigate this parasitic effect in green InGaN single-emitter EEL. Detailed goniophotometric measurements and encircled energy analysis were performed. These were supported by a step-by-step simulation manual to quantify the thermal blooming effect in continuous wave (CW) and PWM modes. The results demonstrate that PWM effectively controls thermal lensing, stabilizes FFPs, and thus improves spatial emission. This practical approach enhances performance and reliability and provides a comprehensive framework for optimizing EEL operation.
Czech name
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Czech description
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Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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