X-ray Diffraction and X-ray Reflectivity Applied to Investigation of Thin Film
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F01%3A00105169" target="_blank" >RIV/00216208:11320/01:00105169 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
X-ray Diffraction and X-ray Reflectivity Applied to Investigation of Thin Film
Original language description
X-ray Diffraction and X-ray Reflectivity Applied to Investigation of Thin Film
Czech name
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Czech description
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Classification
Type
C - Chapter in a specialist book
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Book/collection name
Advances in Solid State Physics
ISBN
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Number of pages of the result
14
Pages from-to
273-286
Number of pages of the book
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Publisher name
B.Kramer
Place of publication
Heidelberg, New York
UT code for WoS chapter
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