Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F06%3A00005609" target="_blank" >RIV/00216208:11320/06:00005609 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Original language description
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Czech name
Charkterizace SiC/SiC kompozitu pomocí difrakce rtg. záření, AFM a pozitronovou anihilační spektroskopií
Czech description
Charkterizace SiC/SiC kompozitu pomocí difrakce rtg. záření, AFM a pozitronovou anihilační spektroskopií
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2006
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
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Volume of the periodical
252
Issue of the periodical within the volume
9
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
10
Pages from-to
3342-3351
UT code for WoS article
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EID of the result in the Scopus database
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