A route to continuous ultra-thin cerium oxide films on Cu(1 1 1)

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F09%3A00206339" target="_blank" >RIV/00216208:11320/09:00206339 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

A route to continuous ultra-thin cerium oxide films on Cu(1 1 1)

Original language description

Cerium oxide deposited by physical vapor deposition of cerium in an oxygen atmosphere on Cu(111) surface growth epitaxially with CeO2(1 1 1) plane parallel to the Cu(111) plane. The growth and morphology of CeO2(1 1 1) films were investigated by means oflow energy electron diffraction (LEED) and scanning tunneling microscopy (STM). LEED shows good long range ordering and STM reveals a three-dimensional growth mode (Vollmer-Weber) with formation of a closed film only at larger thickness. Closed and atomically flat ceria films of larger thickness (3 ML) are obtained by applying a multistep preparation procedure, in which successive ceria layers are homoepitaxially grown on this initial film. The ceria films show similarities with the morphology of CeO2(1 1 1) single crystal surfaces, suggesting the possibility to model bulk ceria by thin film systems.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Surface Science

ISSN

0039-6028

e-ISSN

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Volume of the periodical

603

Issue of the periodical within the volume

23

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

7

Pages from-to

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UT code for WoS article

000272431600009

EID of the result in the Scopus database

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