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Pt-doped tungsten oxide surface: photoemission and RHEED study

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F10%3A10070047" target="_blank" >RIV/00216208:11320/10:10070047 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Pt-doped tungsten oxide surface: photoemission and RHEED study

  • Original language description

    In this paper, we report investigations of the structure and electronic properties of a well-defined Pt/tungsten oxide system prepared on W(110) single-crystal surface. The crystallographic structure and epitaxial orientation were determined by reflexionhigh-energy electron diffraction. The chemical state of the film was investigated by photoelectron spectroscopy induced by an X-ray source as well as by synchrotron radiation photoelectron spectroscopy. The ultrathin Pt layers were deposited on the surface of epitaxial tungsten oxide with (111) planes parallel to the W(110). The formation of three-dimensional Pt clusters with (111) epitaxial plane was observed. It is shown that the Pt deposit caused a partial reduction of the tungsten oxide layer. We found that it is an electronic effect in which the interaction of the Pt deposit with the tungsten oxide enables charge transfer from the W cation to the O anion leading to change of the chemical state.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/LC06058" target="_blank" >LC06058: Center of synchrotron radiation materials study</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Surface and Interface Analysis

  • ISSN

    0142-2421

  • e-ISSN

  • Volume of the periodical

    42

  • Issue of the periodical within the volume

    6-7

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    5

  • Pages from-to

  • UT code for WoS article

    000281149700021

  • EID of the result in the Scopus database