X-ray characterization of semiconductor nanostructures

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F11%3A10103797" target="_blank" >RIV/00216208:11320/11:10103797 - isvavai.cz</a>

Result on the web

<a href="http://iopscience.iop.org/0268-1242/26/6/064002" target="_blank" >http://iopscience.iop.org/0268-1242/26/6/064002</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/0268-1242/26/6/064002" target="_blank" >10.1088/0268-1242/26/6/064002</a>

Result language

angličtina

Original language name

X-ray characterization of semiconductor nanostructures

Original language description

Theoretical description of x-ray scattering from nanostructures is briefly summarized. The application of x-ray scattering for the investigation of the structure of nanocrystals is demonstrated by two characteristic examples comprising standard small-angle x-ray scattering from nanocrystals in an amorphous matrix and x-ray diffraction from crystalline inclusions in an epitaxial layer. New synchrotron-based x-ray scattering methods are briefly discussed.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2011

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Semiconductor Science and Technology

ISSN

0268-1242

e-ISSN

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Volume of the periodical

26

Issue of the periodical within the volume

6

Country of publishing house

GB - UNITED KINGDOM

Number of pages

7

Pages from-to

1-7

UT code for WoS article

000289279300003

EID of the result in the Scopus database

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