Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F20%3A10412333" target="_blank" >RIV/00216208:11320/20:10412333 - isvavai.cz</a>

Alternative codes found

RIV/00216224:14740/20:00117383

Result on the web

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=n7Ubkdu1YB" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=n7Ubkdu1YB</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.pmatsci.2020.100667" target="_blank" >10.1016/j.pmatsci.2020.100667</a>

Result language

angličtina

Original language name

Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy

Original language description

Everybody dreams to have X-ray eyes and discover the most invisible secrets of the world around us. X-rays can probe matter (depth resolved) down to atomic resolution, if relying on diffraction-based techniques. An X-ray diffraction pattern may contain information over many length scales (atomic structure, microstructure, mesostructure). This peculiarity justifies the well-recognized impact of several X-ray diffraction-based techniques to diverse fields of research. On the other hand, X-ray spectroscopies (both in absorption and in emission) provide insights on the electronic structure and, exploiting element selectivity and local environment, can complement or even replace scattering techniques for diluted systems and amorphous materials. Herein, we provide a theoretical foundation which spans from very basic concepts, through well-known techniques, with applications to nanomaterials research. An increasing level of material complexity is explored: size and shape analysis of nanoparticles dispersed in solution or single nanostructures localized onto surfaces; local morphology/strain analysis of nanostructured surfaces; average defects analysis of stacking faulted nanocrystals; regular 2D and 3D lattices of self-assembled nanocrystals; clusters of nanocrystals without any nanoscale lattice order, standing alone as isolated objects or embedded in tenths-of-mu m-thick polymers (here coherent and focused X-rays are mandatory to explore the spatial inhomogeneity and lattice (in)coherence of the materials).

Czech name

—

Czech description

—

Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

<a href="/en/project/GC19-10799J" target="_blank" >GC19-10799J: In-situ study of the growth kinetics of pulsed laser deposition of multiferroic complex oxides</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2020

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Progress in Materials Science

ISSN

0079-6425

e-ISSN

—

Volume of the periodical

112

Issue of the periodical within the volume

červenec

Country of publishing house

GB - UNITED KINGDOM

Number of pages

70

Pages from-to

100667

UT code for WoS article

000536816300006

EID of the result in the Scopus database

2-s2.0-85082709738