All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

X-ray interference effects on the determination of structural data in ultrathin La(2/3)Sr(1/3)MnO(3) epitaxial thin films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F11%3A10105925" target="_blank" >RIV/00216208:11320/11:10105925 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1063/1.3663574" target="_blank" >http://dx.doi.org/10.1063/1.3663574</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1063/1.3663574" target="_blank" >10.1063/1.3663574</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    X-ray interference effects on the determination of structural data in ultrathin La(2/3)Sr(1/3)MnO(3) epitaxial thin films

  • Original language description

    We analyze x-ray diffraction data to extract cell parameters of ultrathin films on closely matching substrates. We focus on epitaxial La2/3Sr1/3MnO3 films grown on (001) SrTiO3 single crystalline substrates. It will be shown that, due to extremely high structural similarity of film and substrate, the data analysis must explicitly consider the distinct phase of the diffracted waves by substrate and films to extract reliable unit cell parameters. The implications of this finding for the understanding of strain effects in ultrathin films and interfaces will be underlined.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Physics Letters

  • ISSN

    0003-6951

  • e-ISSN

  • Volume of the periodical

    99

  • Issue of the periodical within the volume

    22

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    3

  • Pages from-to

  • UT code for WoS article

    000298244500016

  • EID of the result in the Scopus database