Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F11%3A10108221" target="_blank" >RIV/00216208:11320/11:10108221 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.susc.2011.04.036" target="_blank" >http://dx.doi.org/10.1016/j.susc.2011.04.036</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.susc.2011.04.036" target="_blank" >10.1016/j.susc.2011.04.036</a>

Result language
angličtina
Original language name
Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction
Original language description
The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001)and (000 (1) over bar) polar surfaces using the photoemission from the Zn 2p(3/2) and 0 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (000 (1)over bar) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination. (C) 2011 Elsevier B.V. All rights reserved.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
<a href="/en/project/GD202%2F09%2FH041" target="_blank" >GD202/09/H041: Physics of nanostructures</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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