Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F12%3A10130583" target="_blank" >RIV/00216208:11320/12:10130583 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.3682088" target="_blank" >http://dx.doi.org/10.1063/1.3682088</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.3682088" target="_blank" >10.1063/1.3682088</a>
Alternative languages
Result language
angličtina
Original language name
Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains
Original language description
X ray photoelectron diffraction (XPD) patterns of polar zinc oxide (ZnO) surfaces were investigated experimentally using hard x rays and monochromatized Cr K alpha radiation and theoretically using a cluster model approach and a dynamical Bloch wave approach. We focused on photoelectrons emitted from the Zn 2p(3/2) and O 1s orbitals in the analysis. The obtained XPD patterns for the (0001) and (000 (1) over bar) surfaces of a ZnO single crystal were distinct for a given emitter and polarity. Polarity determination of c-axis-textured polycrystalline ZnO thin films was also achieved with the concept of XPD, even though the in-plane orientation of the columnar ZnO grains was random. (C) 2012 American Institute of Physics. [doi:10.1063/1.3682088]
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GD202%2F09%2FH041" target="_blank" >GD202/09/H041: Physics of nanostructures</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Applied Physics
ISSN
0021-8979
e-ISSN
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Volume of the periodical
111
Issue of the periodical within the volume
3
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
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UT code for WoS article
000301029800041
EID of the result in the Scopus database
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