Exciton diffusion length and concentration of holes in MEH-PPV polymer using the surface voltage and surface photovoltage methods

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F12%3A10126233" target="_blank" >RIV/00216208:11320/12:10126233 - isvavai.cz</a>

Alternative codes found

RIV/68378271:_____/12:00390810 RIV/70883521:28110/12:43868136 RIV/70883521:28610/12:43868136

Result on the web

<a href="http://dx.doi.org/10.1016/j.cplett.2012.09.052" target="_blank" >http://dx.doi.org/10.1016/j.cplett.2012.09.052</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.cplett.2012.09.052" target="_blank" >10.1016/j.cplett.2012.09.052</a>

Result language

angličtina

Original language name

Exciton diffusion length and concentration of holes in MEH-PPV polymer using the surface voltage and surface photovoltage methods

Original language description

Novelized method of the surface photovoltage (SPV) measurement convenient for evaluation of exciton diffusion length and thickness of the space charge region (SCR) in organic semiconductors is applied to poly[2-methoxy-5-(2'-ethyl-hexyloxy)-p-phenylene vinylene] (MEH-PPV) polymer. Exciton diffusion length and thickness of the SCR was found. The experiment is complemented by measurements of surface potential by the Kelvin probe force microscopy yielding the work function and concentration of free holes.The latter value is much lower than the concentration of ionized states determined from the thickness of the space charge region, which can be ascribed to the presence of traps.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GBP108%2F12%2FG108" target="_blank" >GBP108/12/G108: Preparation, modification and characterization of materials by radiation</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2012

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Chemical Physics Letters

ISSN

0009-2614

e-ISSN

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Volume of the periodical

552

Issue of the periodical within the volume

november

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

4

Pages from-to

49-52

UT code for WoS article

000310567800008

EID of the result in the Scopus database

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