In-Situ X-Ray Diffraction Study of Thermal Stability of Cu and Cu-Zr Samples Processed by ECAP
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10139990" target="_blank" >RIV/00216208:11320/13:10139990 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.4028/www.scientific.net/MSF.753.279" target="_blank" >http://dx.doi.org/10.4028/www.scientific.net/MSF.753.279</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.4028/www.scientific.net/MSF.753.279" target="_blank" >10.4028/www.scientific.net/MSF.753.279</a>
Alternative languages
Result language
angličtina
Original language name
In-Situ X-Ray Diffraction Study of Thermal Stability of Cu and Cu-Zr Samples Processed by ECAP
Original language description
X-ray diffraction (XRD) studies of ECAP (equal-channel angular pressed) Cu and Cu-Zr were performed after annealing and by in-situ measurements in XRD high-temperature chamber. Significant dependence of thermal stability of fine ECAP microstructure on number of passes was found. In-situ measurements were focused not only on temperature dependence but also on time evolution of the diffraction line profiles. Evaluation in terms of dislocation densities, correlation and crystallite size and its distribution was performed by our own software MSTRUCT developed for total powder diffraction pattern fitting. Abnormal growth of some grains with annealing is well-known for copper and leads to the creation of bimodal microstructure. Therefore a special care mustbe given to the evaluation and a model of two Cu components (larger and smaller crystallites) was fitted to the data if an indication of some crystallite growth appears either in the XRD line profile shape or in two-dimensional diffractio
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP108%2F11%2F1539" target="_blank" >GAP108/11/1539: Nanocrystalline materials - X-ray characterization of structure and its thermal stability</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Materials Science Forum
ISBN
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ISSN
0255-5476
e-ISSN
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Number of pages
6
Pages from-to
279-284
Publisher name
TRANS TECH PUBLICATIONS LTD
Place of publication
STAFA-ZURICH
Event location
Sydney
Event date
May 5, 2013
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000320677500059