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X-ray diffraction investigations of TiO 2 thin films and their thermal stability

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F12%3A10129466" target="_blank" >RIV/00216208:11320/12:10129466 - isvavai.cz</a>

  • Result on the web

    <a href="http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8331579" target="_blank" >http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8331579</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1557/opl.2011.1133" target="_blank" >10.1557/opl.2011.1133</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    X-ray diffraction investigations of TiO 2 thin films and their thermal stability

  • Original language description

    In-situ laboratory measurements in X-ray diffraction (XRD) high-temperature chamber and detailed XRD measurements at room temperature were used for the study of the thickness, temperature and time dependences of crystallization of amorphous TiO 2 thin films. The films deposited by magnetron sputtering, plasma jet sputtering and sol-gel method were analyzed. Tensile stresses were detected in the first two cases. They are generated during the crystallization and inhibit further crystallization that also depends on the film thickness. XRD indicated quite rapid growth of larger crystallites unlike the sol-gel films when the crystallites grow mainly by increasing of annealing temperature.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Materials Research Society Symposium Proceedings

  • ISSN

    0272-9172

  • e-ISSN

  • Volume of the periodical

    1352

  • Issue of the periodical within the volume

    Listopad

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    6

  • Pages from-to

    57-62

  • UT code for WoS article

  • EID of the result in the Scopus database