Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F14%3A10282220" target="_blank" >RIV/00216208:11320/14:10282220 - isvavai.cz</a>
Alternative codes found
RIV/61389013:_____/14:00431010
Result on the web
<a href="http://dx.doi.org/10.1016/j.tsf.2014.06.029" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2014.06.029</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.tsf.2014.06.029" target="_blank" >10.1016/j.tsf.2014.06.029</a>
Alternative languages
Result language
angličtina
Original language name
Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition
Original language description
Vapor phase deposition of poly(ethylene) is shown to produce uncross-linked thin films consisting of linear CH2 (100) oligomers with narrow molar mass distribution of dispersity D-M - 1.10. Early stages of the film formation are characterized by the growth of two-dimensional compact islands of constant 7-8 nm thickness. The transversal evolution of islands is studied in the context of the Dynamic Scaling Theory. The aggregation regime is found to be valid in a narrow range of coverage 0.1 < theta < 0.3.The critical island size is estimated to be i = 1. Kinetic roughening of the growing front gives a set of the scaling exponents alpha(loc) = 0.67, alpha(s) = 0.85, beta = 0.33 (beta = 0.2 for the late stages of growth) and z = 2.2 that does not fit intoany of the known universality classes. Macromolecular relaxation at the island edges is suggested to explain the observed inconsistence.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Thin Solid Films
ISSN
0040-6090
e-ISSN
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Volume of the periodical
565
Issue of the periodical within the volume
August
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
12
Pages from-to
249-260
UT code for WoS article
000341054600038
EID of the result in the Scopus database
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