All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Mechanical stress and stress release channels in 10-350 nm palladium hydrogen thin films with different micro-structures

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F16%3A10334722" target="_blank" >RIV/00216208:11320/16:10334722 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.actamat.2016.05.023" target="_blank" >http://dx.doi.org/10.1016/j.actamat.2016.05.023</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.actamat.2016.05.023" target="_blank" >10.1016/j.actamat.2016.05.023</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Mechanical stress and stress release channels in 10-350 nm palladium hydrogen thin films with different micro-structures

  • Original language description

    For thin metal films adhered to rigid substrates hydrogen uptake results in compressive stresses in the GPa range. Stresses affect the thermodynamics as well as the durability of thin films, but many films can release stress above critical stress values. Depending on the films' thickness, microstructure and adhesion to the substrate, which determine the energy available in the nano-sized system, stress release is conducted via different release mechanisms. To evaluate the different mechanisms, Palladium thin films ranging from 10 nm to 350 nm and with three different types of microstructures (nanocrystalline, multi oriented epitaxy and three-fold epitaxy) are studied with special focus on the mechanical stress. In-situ substrate curvature measurements, XRD stress analyses and acoustic emission (AE) measurements are conducted to determine intrinsic stresses, hydrogen-induced stress changes and stress release signals. By this complementary experimental approach, different stress release mechanisms (named channels) are identified. Discrete stress relaxation (DSR) events are found already within the overall linear elastic stress-strain regime. Energies to stimulate DSR5 lay well below the formation energy of dislocations, and may allow the movement of defects pre-existing in the films. For higher strain energies, all studied films can release stress by the formation of new dislocations and plastic deformation. When the adhesion to the substrate is small, an alternative release channel of film buckling opens for thick films.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GBP108%2F12%2FG043" target="_blank" >GBP108/12/G043: Interface controlled properties of micro/nanocrystalline materials for advanced structural applications, biodegradable implants and hydrogen storage</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Acta Materialia

  • ISSN

    1359-6454

  • e-ISSN

  • Volume of the periodical

    114

  • Issue of the periodical within the volume

    -

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    10

  • Pages from-to

    116-125

  • UT code for WoS article

    000378962600012

  • EID of the result in the Scopus database

    2-s2.0-84969497980