Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10363419" target="_blank" >RIV/00216208:11320/17:10363419 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1107/S1600576717000565" target="_blank" >http://dx.doi.org/10.1107/S1600576717000565</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S1600576717000565" target="_blank" >10.1107/S1600576717000565</a>
Alternative languages
Result language
angličtina
Original language name
Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction
Original language description
The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by 60 degrees. The bulk crystal orientation is mapped out using SXRM by measuring the diffracted X-ray intensity of an asymmetric Bragg peak using a nano-focused X-ray beam scanned over the sample. By comparing bulk-and surface-sensitive measurements of the same area, buried twin domains not visible on the surface are identified. The lateral twin domain size is found to increase with the film thickness.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Applied Crystallography [online]
ISSN
1600-5767
e-ISSN
—
Volume of the periodical
50
Issue of the periodical within the volume
leden
Country of publishing house
JP - JAPAN
Number of pages
9
Pages from-to
369-377
UT code for WoS article
000399010000005
EID of the result in the Scopus database
2-s2.0-85017179519