Influence of latent heat released from solder joints II: PCB deformation during reflow and pad cratering defects
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10364872" target="_blank" >RIV/00216208:11320/17:10364872 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21230/17:00311505
Result on the web
<a href="http://dx.doi.org/10.1007/s10854-016-5630-y" target="_blank" >http://dx.doi.org/10.1007/s10854-016-5630-y</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s10854-016-5630-y" target="_blank" >10.1007/s10854-016-5630-y</a>
Alternative languages
Result language
angličtina
Original language name
Influence of latent heat released from solder joints II: PCB deformation during reflow and pad cratering defects
Original language description
This work is focused on the deformation of FR4 laminate, a material used to form many basic components of electronic assemblies, during the reflow process. The thermal expansion of FR4 was assessed from room temperature up to 250 degrees C. The dilatation characteristics of the laminate were found to be highly anisotropic in three directions. Special attention was paid to the irreversible changes in the laminate after the first thermal cycle, and the results were used to analyze the effects of latent heat on the deformation of FR4 during reflow. The latent heat released during solidification of a solder joint heats not only the joint but also its surrounding, leading to localized expansion of all materials around the joint and potentially causing pad cratering. Thermal expansion measurements demonstrated that the coefficient of thermal expansion (CTE) of the FR4 laminate in the z direction was at least 10 times that of the adjacent materials in the electronics assembly. This large difference in the CTE leads to residual strains in the assembly. An analysis of this problem is presented, and a model for the effect of latent heat on the FR4 deformation is proposed.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/LM2011025" target="_blank" >LM2011025: MLTL - Magnetism and Low Temperature Laboratories - operation and development of national research infrastructure</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Materials Science: Materials in Electronics
ISSN
0957-4522
e-ISSN
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Volume of the periodical
28
Issue of the periodical within the volume
1
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
8
Pages from-to
1070-1077
UT code for WoS article
000392308700140
EID of the result in the Scopus database
2-s2.0-84984804831