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Photoluminescence performance limits of Si nanocrystals in silicon oxynitride matrices

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10367383" target="_blank" >RIV/00216208:11320/17:10367383 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1063/1.4999023" target="_blank" >http://dx.doi.org/10.1063/1.4999023</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1063/1.4999023" target="_blank" >10.1063/1.4999023</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Photoluminescence performance limits of Si nanocrystals in silicon oxynitride matrices

  • Original language description

    The present comprehensive study of photoluminescence (PL) quantum yield (QY) of Si nanocrystals (SiNCs) in Si-rich oxynitride (SRON) superlattices was performed over a broad set of samples. The PL QY is sensitive mostly to the thickness of SRON and barrier oxide layers and to the passivation procedures. Annealing in hydrogen improves the QY proportionally to the NC surface area by passivating the NC/oxide interface defects present at a surface density of about 2.5 x 10(12) cm(-2). The maximum external QY of nearly 30% is found in well-passivated superlattices with a SiNC size of about 4 nm and a SiO2 barrier thickness of 2 nm or larger. We reveal the existence of an extended near-infrared tail of the PL spectra, whose weak intensity anti-correlates with the external QY. The relative intensity of this emission increases with temperature as well as for strong excitation above the PL saturation level and may be related to excitation energy transfer to the structural defects near NCs. Finally, we discuss the possible mechanisms which are responsible for limiting the attainable PL QY and which may be the subject of future efforts to further increase the PL QY. Published by AIP Publishing.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    <a href="/en/project/GC16-09745J" target="_blank" >GC16-09745J: Understanding the Luminescence Efficiency of Silicon Quantum Dots</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Applied Physics

  • ISSN

    0021-8979

  • e-ISSN

  • Volume of the periodical

    122

  • Issue of the periodical within the volume

    14

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    9

  • Pages from-to

  • UT code for WoS article

    000413038500022

  • EID of the result in the Scopus database