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Transverse magnetooptic effect in multilayers applied to mapping of microwave currents

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10369087" target="_blank" >RIV/00216208:11320/17:10369087 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1364/OME.7.002368" target="_blank" >http://dx.doi.org/10.1364/OME.7.002368</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1364/OME.7.002368" target="_blank" >10.1364/OME.7.002368</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Transverse magnetooptic effect in multilayers applied to mapping of microwave currents

  • Original language description

    A sensor capable of mapping microwave (mw) currents in semiconductor circuits can be realized by exploiting magneto-optic effects (MO) at transverse magnetization (M-perpendicular to) in ultrathin ferromagnetic or ferrimagnetic films. In the sensor, M-perpendicular to would be induced in the magnetic film by the fringing fields of mw currents flowing in the semiconductor circuit along the plane of incidence. In this work, an evaluation of MO sensor performance was made for nanostructures consisting of ultrathin Fe layers sandwiched between AlN dielectric layers. The multilayer thin film stacks were grown on Si wafer substrates. The performance of the sensor systems is characterized in terms of magnetization-induced changes in the MO multilayer reflection coefficients, expressed analytically. Sensor configurations which optimize the operation at the laser wavelength of 410 nm, and which are still easy to fabricate, are proposed. Modeling predicts the strongest MO enhancement in a sensor incorporating two Fe nanolayers, each of a different thickness, formed by the layer sequence AlN/Fe/AlN/Fe/AlN/Au/Si. The use of ferrimagnetic hexagonal ferrite films with the in-plane c-axis as an alternative sensor material is also discussed. (C) 2017 Optical Society of America

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    <a href="/en/project/GA15-21547S" target="_blank" >GA15-21547S: Characterization of magnetic nanostructures with optical techniques</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Optical Materials Express

  • ISSN

    2159-3930

  • e-ISSN

  • Volume of the periodical

    7

  • Issue of the periodical within the volume

    7

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    19

  • Pages from-to

    2368-2386

  • UT code for WoS article

    000404735600024

  • EID of the result in the Scopus database

    2-s2.0-85021075504