Transverse magnetooptic effect in multilayers applied to mapping of microwave currents
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10369087" target="_blank" >RIV/00216208:11320/17:10369087 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1364/OME.7.002368" target="_blank" >http://dx.doi.org/10.1364/OME.7.002368</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/OME.7.002368" target="_blank" >10.1364/OME.7.002368</a>
Alternative languages
Result language
angličtina
Original language name
Transverse magnetooptic effect in multilayers applied to mapping of microwave currents
Original language description
A sensor capable of mapping microwave (mw) currents in semiconductor circuits can be realized by exploiting magneto-optic effects (MO) at transverse magnetization (M-perpendicular to) in ultrathin ferromagnetic or ferrimagnetic films. In the sensor, M-perpendicular to would be induced in the magnetic film by the fringing fields of mw currents flowing in the semiconductor circuit along the plane of incidence. In this work, an evaluation of MO sensor performance was made for nanostructures consisting of ultrathin Fe layers sandwiched between AlN dielectric layers. The multilayer thin film stacks were grown on Si wafer substrates. The performance of the sensor systems is characterized in terms of magnetization-induced changes in the MO multilayer reflection coefficients, expressed analytically. Sensor configurations which optimize the operation at the laser wavelength of 410 nm, and which are still easy to fabricate, are proposed. Modeling predicts the strongest MO enhancement in a sensor incorporating two Fe nanolayers, each of a different thickness, formed by the layer sequence AlN/Fe/AlN/Fe/AlN/Au/Si. The use of ferrimagnetic hexagonal ferrite films with the in-plane c-axis as an alternative sensor material is also discussed. (C) 2017 Optical Society of America
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/GA15-21547S" target="_blank" >GA15-21547S: Characterization of magnetic nanostructures with optical techniques</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Optical Materials Express
ISSN
2159-3930
e-ISSN
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Volume of the periodical
7
Issue of the periodical within the volume
7
Country of publishing house
US - UNITED STATES
Number of pages
19
Pages from-to
2368-2386
UT code for WoS article
000404735600024
EID of the result in the Scopus database
2-s2.0-85021075504