Characterization of polarizing semiconductor radiation detectors by laser-induced transient currents

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10369827" target="_blank" >RIV/00216208:11320/17:10369827 - isvavai.cz</a>

Alternative codes found

RIV/68081723:_____/17:00495539

Result on the web

<a href="http://dx.doi.org/10.1063/1.4997404" target="_blank" >http://dx.doi.org/10.1063/1.4997404</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.4997404" target="_blank" >10.1063/1.4997404</a>

Result language

angličtina

Original language name

Characterization of polarizing semiconductor radiation detectors by laser-induced transient currents

Original language description

A method is presented for the determination of the carrier drift mobility, lifetime, electric field distribution, and the dynamics of space charge formation, including the detrapping energy and capture cross-section of the dominant trap level in polarizing semiconductor radiation detectors. The procedure stems from the laser-induced transient current measurements done at a steady-state and pulsed biasing and at variable temperature. The approach allows us the direct determination of detector parameters from measured data without a complex mathematical treatment. The detrimental effect of surface carrier recombination often hampering the evaluation of detector properties is eliminated. Lifetime worsening caused by the space charge formation is included. The usefulness of the procedure is demonstrated on a CdTe radiation detector. Published by AIP Publishing.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

<a href="/en/project/GA16-23165S" target="_blank" >GA16-23165S: Preparation of electric contacts on CdTe and CdZnTe radiation detectors</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2017

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Physics Letters

ISSN

0003-6951

e-ISSN

—

Volume of the periodical

111

Issue of the periodical within the volume

8

Country of publishing house

US - UNITED STATES

Number of pages

5

Pages from-to

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UT code for WoS article

000408570000013

EID of the result in the Scopus database

2-s2.0-85028539418