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Analysis of the Sn chain length fluctuations on Si(100) 2 x 1: An extraction of microscopic parameters

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10371707" target="_blank" >RIV/00216208:11320/17:10371707 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1103/PhysRevB.96.045430" target="_blank" >http://dx.doi.org/10.1103/PhysRevB.96.045430</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1103/PhysRevB.96.045430" target="_blank" >10.1103/PhysRevB.96.045430</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Analysis of the Sn chain length fluctuations on Si(100) 2 x 1: An extraction of microscopic parameters

  • Original language description

    Tin chains grown on the Si(100) 2 x 1 surface were studied by scanning tunneling microscopy. Real time measurements were used for recording chain length fluctuations in a temperature range from 310 to 350 K. The recorded data were analyzed by means of a statistical model containing both interfering processes observed at a chain termination-random attachment and detachment of metal atoms. Rates of the both processes were calculated from lifetimes of two different chain terminations (monomer or dimer) by means of derived formulas. The activation energies for the detachment and frequency prefactors were calculated from dependence of the corresponding time constants on temperature in an Arrhenius plot. A similar approach was used for characterization of binding Sn atoms on C-type defects which represent preferential adsorption sites.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10305 - Fluids and plasma physics (including surface physics)

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Physical Review B

  • ISSN

    2469-9950

  • e-ISSN

  • Volume of the periodical

    96

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    7

  • Pages from-to

  • UT code for WoS article

    000406292600011

  • EID of the result in the Scopus database

    2-s2.0-85026395209