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Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10370912" target="_blank" >RIV/00216208:11320/18:10370912 - isvavai.cz</a>

  • Alternative codes found

    RIV/68378271:_____/18:00487414

  • Result on the web

    <a href="http://dx.doi.org/10.1107/S1600577517017362" target="_blank" >http://dx.doi.org/10.1107/S1600577517017362</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1107/S1600577517017362" target="_blank" >10.1107/S1600577517017362</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold

  • Original language description

    The durability of grazing-and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of pulses up to 16 million shots and various fluence levels below 10% of the single-shot damage threshold. The experiment was performed at FLASH, the Free-electron LASer in Hamburg, using 13.5 nm extreme UV (EUV) radiation with 100 fs pulse duration. Polycrystalline ruthenium and amorphous carbon 50 nm thin films on silicon substrates were tested at total external reflection angles of 20 degrees and 10 degrees grazing incidence, respectively. Mo/Si periodical multilayer structures were tested in the Bragg reflection condition at 16 degrees off-normal angle of incidence. The exposed areas were analysed post-mortem using differential contrast visible light microscopy, EUV reflectivity mapping and scanning X-ray photoelectron spectroscopy. The analysis revealed that Ru and Mo/Si coatings exposed to the highest dose and fluence level show a few per cent drop in their EUV reflectivity, which is explained by EUV-induced oxidation of the surface.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10305 - Fluids and plasma physics (including surface physics)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Synchrotron Radiation [online]

  • ISSN

    1600-5775

  • e-ISSN

  • Volume of the periodical

    2018

  • Issue of the periodical within the volume

    25

  • Country of publishing house

    JP - JAPAN

  • Number of pages

    8

  • Pages from-to

    77-84

  • UT code for WoS article

    000418593300013

  • EID of the result in the Scopus database

    2-s2.0-85038971075