Ultrafast scanning electron microscope applied for studying the interaction between free electrons and optical near-fields of periodic nanostructures

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10384477" target="_blank" >RIV/00216208:11320/18:10384477 - isvavai.cz</a>

Result on the web

<a href="https://doi.org/10.1063/1.5032093" target="_blank" >https://doi.org/10.1063/1.5032093</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.5032093" target="_blank" >10.1063/1.5032093</a>

Result language

angličtina

Original language name

Ultrafast scanning electron microscope applied for studying the interaction between free electrons and optical near-fields of periodic nanostructures

Original language description

In this paper, we describe an ultrafast scanning electron microscope setup developed for the research of inelastic scattering of electrons at optical near-fields of periodic dielectric nanostructures. Electron emission from the Schottky cathode is controlled by ultraviolet femtosecond laser pulses. The electron pulse duration at the interaction site is characterized via cross-correlation of the electrons with an infrared laser pulse that excites a synchronous periodic near-field on the surface of a silicon nanostructure. The lower limit of 410 fs is found in the regime of a single electron per pulse. The role of pulse broadening due to Coulomb interaction in multielectron pulses is investigated. The setup is used to demonstrate an increase in the interaction distance between the electrons and the optical near-fields by introducing a pulse-front-tilt to the infrared laser beam. Furthermore, we show the dependence of the final electron spectra on the resonance condition between the phase velocity of the optical near-field and the electron propagation velocity. The resonance is controlled by adjusting the initial electron energy/velocity and by introducing a linear chirp to the structure period allowing the increase of the final electron energy gain up to a demonstrated value of 3.8 keV. Published by AIP Publishing.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

10306 - Optics (including laser optics and quantum optics)

Project

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Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Applied Physics

ISSN

0021-8979

e-ISSN

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Volume of the periodical

124

Issue of the periodical within the volume

2

Country of publishing house

US - UNITED STATES

Number of pages

10

Pages from-to

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UT code for WoS article

000438566400004

EID of the result in the Scopus database

2-s2.0-85049955419