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Photoluminescence of the integrating sphere walls, its influence on the absolute quantum yield measurements and correction methods

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10384577" target="_blank" >RIV/00216208:11320/18:10384577 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1063/1.5052601" target="_blank" >https://doi.org/10.1063/1.5052601</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1063/1.5052601" target="_blank" >10.1063/1.5052601</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Photoluminescence of the integrating sphere walls, its influence on the absolute quantum yield measurements and correction methods

  • Original language description

    Determination of the absolute quantum yield (QY) of photoluminescence (PL) or electroluminescence is commonly performed using an integrating sphere (IS) - versatile device for radiometry applications. The key feature of IS is very high diffused reflectance of its internal surface. Two materials are commonly used: (a) the sintered high-density polytetrafluoroethylene (Spectralon) and (b) materials based on barium sulphate (Spectraflect). Using PL-micro-spectroscopy we show that both materials reveal PL from localized centers excitable by UV, blue and green light emitting broad PL spectrum extending up to the red spectral region. The main effect of PL from IS-walls is introduction of non-constant parasitic background which is mixed with PL from a tested sample during the QY measurements. We develop theoretical description of QY determination which includes effects of PL from IS walls. This allows us to propose and test a reliable and universal correction for the IS-related PL background. Finally, a method of &quot;black sample&quot; is proposed and applied to estimate PL QY of Spectraflect which is shown to decrease from 0.09 to 0.015% for excitation shift from 320 to 440 nm. (c) 2018 Author(s).

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10306 - Optics (including laser optics and quantum optics)

Result continuities

  • Project

    <a href="/en/project/GA16-22092S" target="_blank" >GA16-22092S: Fluoride nanostructural thin films with outstanding optical and luminescence properties</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    AIP Advances

  • ISSN

    2158-3226

  • e-ISSN

  • Volume of the periodical

    8

  • Issue of the periodical within the volume

    10

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    11

  • Pages from-to

  • UT code for WoS article

    000448957900137

  • EID of the result in the Scopus database

    2-s2.0-85055257629