Photoluminescence of the integrating sphere walls, its influence on the absolute quantum yield measurements and correction methods
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10384577" target="_blank" >RIV/00216208:11320/18:10384577 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1063/1.5052601" target="_blank" >https://doi.org/10.1063/1.5052601</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.5052601" target="_blank" >10.1063/1.5052601</a>
Alternative languages
Result language
angličtina
Original language name
Photoluminescence of the integrating sphere walls, its influence on the absolute quantum yield measurements and correction methods
Original language description
Determination of the absolute quantum yield (QY) of photoluminescence (PL) or electroluminescence is commonly performed using an integrating sphere (IS) - versatile device for radiometry applications. The key feature of IS is very high diffused reflectance of its internal surface. Two materials are commonly used: (a) the sintered high-density polytetrafluoroethylene (Spectralon) and (b) materials based on barium sulphate (Spectraflect). Using PL-micro-spectroscopy we show that both materials reveal PL from localized centers excitable by UV, blue and green light emitting broad PL spectrum extending up to the red spectral region. The main effect of PL from IS-walls is introduction of non-constant parasitic background which is mixed with PL from a tested sample during the QY measurements. We develop theoretical description of QY determination which includes effects of PL from IS walls. This allows us to propose and test a reliable and universal correction for the IS-related PL background. Finally, a method of "black sample" is proposed and applied to estimate PL QY of Spectraflect which is shown to decrease from 0.09 to 0.015% for excitation shift from 320 to 440 nm. (c) 2018 Author(s).
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
<a href="/en/project/GA16-22092S" target="_blank" >GA16-22092S: Fluoride nanostructural thin films with outstanding optical and luminescence properties</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
AIP Advances
ISSN
2158-3226
e-ISSN
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Volume of the periodical
8
Issue of the periodical within the volume
10
Country of publishing house
US - UNITED STATES
Number of pages
11
Pages from-to
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UT code for WoS article
000448957900137
EID of the result in the Scopus database
2-s2.0-85055257629