Oxidation and erosion of single crystal CdTe surface in distilled water and NaCl solution
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F19%3A10399553" target="_blank" >RIV/00216208:11320/19:10399553 - isvavai.cz</a>
Result on the web
<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=.zJfV7FJRb" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=.zJfV7FJRb</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.tsf.2019.137426" target="_blank" >10.1016/j.tsf.2019.137426</a>
Alternative languages
Result language
angličtina
Original language name
Oxidation and erosion of single crystal CdTe surface in distilled water and NaCl solution
Original language description
Surface oxide formation was examined on low resistivity p-type CdTe single crystals immersed into distilled water held at 50 degrees C. The oxide thickness and roughness were investigated by spectroscopic ellipsometry, and its composition was studied by X-ray photoelectron spectroscopy. It was observed that after the fast growth of thin oxide layer with the thickness 1.7 nm the growth of oxide layer is proportional to a square root of the immersion time. The oxidation was described by a model in which the oxidation rate is limited by the drift of positive Cd ions from the CdTe-oxide interface into water. The penetration of Na and erosion of CdTe immersed in saturated NaCl solution was investigated by secondary ion mass spectrometry measurements on samples treated in NaCl solution for different time intervals. Very low determined diffusion coefficient of Na was explained by trapping of Na on acceptor-type defects in Cd sublattice.
Czech name
—
Czech description
—
Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/GA16-23165S" target="_blank" >GA16-23165S: Preparation of electric contacts on CdTe and CdZnTe radiation detectors</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Thin Solid Films
ISSN
0040-6090
e-ISSN
—
Volume of the periodical
686
Issue of the periodical within the volume
6
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
6
Pages from-to
137426
UT code for WoS article
000480474400015
EID of the result in the Scopus database
2-s2.0-85069920802