Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F16%3A10331248" target="_blank" >RIV/00216208:11320/16:10331248 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1080/14686996.2016.1250105" target="_blank" >http://dx.doi.org/10.1080/14686996.2016.1250105</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1080/14686996.2016.1250105" target="_blank" >10.1080/14686996.2016.1250105</a>

Result language

angličtina

Original language name

Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

Original language description

We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions. From X-ray photoelectron spectroscopy measurements, we found that the oxide consists only of oxygen bound to tellurium. We applied a refined theoretical model of the surface layer to evaluate the spectroscopic ellipsometry measurements. In this way we studied the dynamics and growth rate of the oxide layer within a month after chemical etching of the samples. We observed two phases in the evolution of the oxide layer on all studied samples. A rapid growth was visible within five days after the chemical treatment followed by semi-saturation and a decrease in the growth rate after the first week. After one month all the samples showed an oxide layer about 3 nm thick. The oxide thickness was correlated with leakage current degradation with time after surface preparation.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2016

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Science and Technology of Advanced Materials

ISSN

1468-6996

e-ISSN

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Volume of the periodical

17

Issue of the periodical within the volume

1

Country of publishing house

JP - JAPAN

Number of pages

7

Pages from-to

792-798

UT code for WoS article

000390548100002

EID of the result in the Scopus database

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