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Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F19%3A10405417" target="_blank" >RIV/00216208:11320/19:10405417 - isvavai.cz</a>

  • Alternative codes found

    RIV/61388971:_____/20:00540637 RIV/61388963:_____/20:00519385 RIV/00216208:11320/20:10405417

  • Result on the web

    <a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=BMHgnR3bvR" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=BMHgnR3bvR</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1002/pssa.201900698" target="_blank" >10.1002/pssa.201900698</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si

  • Original language description

    Herein, the spectral dependencies of the dispersion factor beta (from the stretched exponential function) and photoluminescence (PL) quantum yield (QY) of silicon nanocrystals (Si NCs) are thoroughly studied. Spectrally resolved PL decay kinetics of Si NCs in both liquid and solid samples are measured and their corresponding distributions of rates are retrieved by means of the hybrid maximum-entropy method. This enables us to demonstrate a direct correlation of dispersion factor beta with the width of rate distribution. Here, the evidence of the same step-like spectral dependence of rate distribution widths (dispersion factor) for different forms of nanocrystalline silicon (including porous silicon and chemically synthesized Si NCs) is presented suggesting intrinsic (core-related) origin of rate distributions. Spectral dependence of normalized QY of Si NCs reveals two characteristic peaks with spectral positions at approximate to 1.42 and approximate to 1.68 eV. A similar peak in QY spectral dependence of CdSe quantum dots (QDs) is found, which suggests its common origin regardless the material of semiconductor QDs.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10306 - Optics (including laser optics and quantum optics)

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Physica Status Solidi (A) Applications and Materials

  • ISSN

    1862-6300

  • e-ISSN

  • Volume of the periodical

    2019

  • Issue of the periodical within the volume

    prosinec

  • Country of publishing house

    DE - GERMANY

  • Number of pages

    12

  • Pages from-to

    1900698

  • UT code for WoS article

    000503019200001

  • EID of the result in the Scopus database

    2-s2.0-85076765581