Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388963%3A_____%2F20%3A00519385" target="_blank" >RIV/61388963:_____/20:00519385 - isvavai.cz</a>
Alternative codes found
RIV/00216208:11320/19:10405417 RIV/61388971:_____/20:00540637 RIV/00216208:11320/20:10405417
Result on the web
<a href="https://onlinelibrary.wiley.com/doi/full/10.1002/pssa.201900698" target="_blank" >https://onlinelibrary.wiley.com/doi/full/10.1002/pssa.201900698</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/pssa.201900698" target="_blank" >10.1002/pssa.201900698</a>
Alternative languages
Result language
angličtina
Original language name
Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si
Original language description
Herein, the spectral dependencies of the dispersion factor beta (from the stretched exponential function) and photoluminescence (PL) quantum yield (QY) of silicon nanocrystals (Si NCs) are thoroughly studied. Spectrally resolved PL decay kinetics of Si NCs in both liquid and solid samples are measured and their corresponding distributions of rates are retrieved by means of the hybrid maximum-entropy method. This enables us to demonstrate a direct correlation of dispersion factor beta with the width of rate distribution. Here, the evidence of the same step-like spectral dependence of rate distribution widths (dispersion factor) for different forms of nanocrystalline silicon (including porous silicon and chemically synthesized Si NCs) is presented suggesting intrinsic (core-related) origin of rate distributions. Spectral dependence of normalized QY of Si NCs reveals two characteristic peaks with spectral positions at approximate to 1.42 and approximate to 1.68 eV. A similar peak in QY spectral dependence of CdSe quantum dots (QDs) is found, which suggests its common origin regardless the material of semiconductor QDs.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10403 - Physical chemistry
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physica Status Solidi. A
ISSN
1862-6300
e-ISSN
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Volume of the periodical
217
Issue of the periodical within the volume
4
Country of publishing house
DE - GERMANY
Number of pages
12
Pages from-to
1900698
UT code for WoS article
000503019200001
EID of the result in the Scopus database
2-s2.0-85076765581