Probing the Mechanical Properties of 2D Materials via Atomic-Force-Microscopy-Based Modulated Nanoindentation

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F24%3A10473329" target="_blank" >RIV/00216208:11320/24:10473329 - isvavai.cz</a>

Result on the web

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=iov6RG28IQ" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=iov6RG28IQ</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1002/smtd.202301043" target="_blank" >10.1002/smtd.202301043</a>

Result language

angličtina

Original language name

Probing the Mechanical Properties of 2D Materials via Atomic-Force-Microscopy-Based Modulated Nanoindentation

Original language description

As the field of low-dimensional materials (1D or 2D) grows and more complex and intriguing structures are continuing to be found, there is an emerging need for techniques to characterize the nanoscale mechanical properties of all kinds of 1D/2D materials, in particular in their most practical state: sitting on an underlying substrate. While traditional nanoindentation techniques cannot accurately determine the transverse Young&apos;s modulus at the necessary scale without large indentations depths and effects to and from the substrate, herein an atomic-force-microscopy-based modulated nanomechanical measurement technique with Angstrom-level resolution (MoNI/angstrom I) is presented. This technique enables non-destructive measurements of the out-of-plane elasticity of ultra-thin materials with resolution sufficient to eliminate any contributions from the substrate. This method is used to elucidate the multi-layer stiffness dependence of graphene deposited via chemical vapor deposition and discover a peak transverse modulus in two-layer graphene. While MoNI/angstrom I has been used toward great findings in the recent past, here all aspects of the implementation of the technique as well as the unique challenges in performing measurements at such small resolutions are encompassed. Modulated nanoindentation, or MoNI, is an atomic-force-microscopy-based nano-indentation technique for measuring the mechanical properties of 2D materials with angstrom and nN resolution. This technique is demonstrated on the measurement of the transverse Young&apos;s modulus and mechanical response of 2D graphene thin films with varying number of atomic layers.image

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

—

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Small Methods

ISSN

2366-9608

e-ISSN

—

Volume of the periodical

8

Issue of the periodical within the volume

3

Country of publishing house

DE - GERMANY

Number of pages

10

Pages from-to

2301043

UT code for WoS article

001108802000001

EID of the result in the Scopus database

2-s2.0-85178095975