Scanning probe microscopy as a tool for investigation of biomaterials
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14110%2F12%3A00063082" target="_blank" >RIV/00216224:14110/12:00063082 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Scanning probe microscopy as a tool for investigation of biomaterials
Original language description
Super-microscopic techniques like scanning tunnelling microscopy, atomic force microscopy or scanning near-field optical microscopy allows investigate micro- and/or nano-scale surfaces and structures. In this paper, both Environmental scanning electron microscope (ESEM) and Scanning near field optical microscope (SNOM) have been applied to more closely study of biomaterials. The results of visualization of human osteosarcoma cell line (U2OS) are compared. SNOM and ESEM yield different, however, comparable and complementary information on studied biological samples.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Advances in Electrical and Electronic Engineering
ISSN
1336-1376
e-ISSN
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Volume of the periodical
10
Issue of the periodical within the volume
5
Country of publishing house
CZ - CZECH REPUBLIC
Number of pages
5
Pages from-to
350-354
UT code for WoS article
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EID of the result in the Scopus database
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