Nanometric applications of the Scanning Near-field optical microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU31701" target="_blank" >RIV/00216305:26220/03:PU31701 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Nanometric applications of the Scanning Near-field optical microscopy

Original language description

Scanning near-field optical microscopy (SNOM or NSOM) involves the potential and technology of scanning probe microscopes and performance of optical microscopes. SNOM combines the excellent spectral and temporal resolution of classical microscopes with spatial resolution better than 100 nm. In this paper the review of basic principles of aperture SNOM and some of its applications are desribed.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proceedings of the National Conference NANO 02

ISBN

80-7329-027-8

ISSN

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e-ISSN

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Number of pages

4

Pages from-to

166-169

Publisher name

Česká společnost pro nové materiály a technologie

Place of publication

Brno

Event location

Brno

Event date

Nov 19, 2002

Type of event by nationality

CST - Celostátní akce

UT code for WoS article

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