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Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F01%3A00005240" target="_blank" >RIV/00216224:14310/01:00005240 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216275:25310/01:00000025

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

  • Original language description

    In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from thesubstrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2001

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Optoelectronics and Advanced Materials

  • ISSN

    1454-4164

  • e-ISSN

  • Volume of the periodical

    3

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    RU - RUSSIAN FEDERATION

  • Number of pages

    6

  • Pages from-to

    873

  • UT code for WoS article

  • EID of the result in the Scopus database