Temperature Dependence of the Optical Spectra of SiGe Alloys
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F02%3A00006319" target="_blank" >RIV/00216224:14310/02:00006319 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Temperature Dependence of the Optical Spectra of SiGe Alloys
Original language description
The temperature evolution of the interband electronic response of Si1-xGex alloys is reported and analyzed. Our study of the critical-point structure in the complex dielectric function is based mostly on ellipsometric measurements in the 80-800K range. Several ways of obtaining the critical point parameters are used and discussed. We pay special attention to surface overlayers which are the main obstacle in obtaining true optical response functions from the measured data. The temperature changes of critical point energies, broadening parameters, and phase-shifts are tabulated. We discuss the alloy data with a special emphasis on their relations to the results for both constituents, Si and Ge.
Czech name
—
Czech description
—
Classification
Type
C - Chapter in a specialist book
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
—
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Book/collection name
Silicon-Germanium Carbon Alloys
ISBN
1-56032-963-7
Number of pages of the result
48
Pages from-to
483
Number of pages of the book
—
Publisher name
Taylor & Francis
Place of publication
New York
UT code for WoS chapter
—