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Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F04%3A00010514" target="_blank" >RIV/00216224:14310/04:00010514 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance

  • Original language description

    NDE activities at the Laboratory for Acoustic Diagnosis and Quality Assurance (EADQ) Dresden are outlined. The applied methods comprise acoustic, thermal, optical and X-ray ones. Additionally, scanning probe methods (SPM) and scanning electron microscopy(SEM) are used. Combinations of different methods are especially effective. This is demonstrated for the coupling of an acoustic approach with SEM. For NDE on a micro- and nano-meter scale, preparation of appropriate test flaws and the verification of the NDE results turn out to be a challenge. To meet this challenge, we propose an approach based on focused ion beam technique.

  • Czech name

    Mikro a nano NDT v laboratoři pro akustickou diagnostiku a kontrolu kvality

  • Czech description

    Publikace shrnuje metody používané v laboratoři EADQ. Tyto metody zahrnují akustické, termické, optické a rtg, a mikroskopii, a je podtrženo jejich použití pro mikro a nanostruktury.

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II

  • ISSN

    0-8194-5309-9

  • e-ISSN

  • Volume of the periodical

    5392

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    15

  • Pages from-to

    63-77

  • UT code for WoS article

  • EID of the result in the Scopus database