Diffraction effects in infrared ellipsometry of conducting samples

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F04%3A00021209" target="_blank" >RIV/00216224:14310/04:00021209 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Diffraction effects in infrared ellipsometry of conducting samples
Original language description
We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
Czech name
Difrakční efekty v infračervené elipsometrii vodivých vzorků
Czech description
We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.

Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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