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Electromagnetic field distribution modelling in microlenses fabrication process

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F07%3A00030102" target="_blank" >RIV/00216224:14310/07:00030102 - isvavai.cz</a>

  • Alternative codes found

    RIV/00177016:_____/07:#0000391

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Electromagnetic field distribution modelling in microlenses fabrication process

  • Original language description

    In this article, theoretical modelling of electromagnetic field distribution in the exposed thin film during lithographic process of microlenses array formation is presented. While studying topography of microlenses by means of atomic force microscopy wehave found that various diffraction effects are observed due to the small dimensions of microlens patterns comparing to the wavelength. In this article we use finite-difference in time domain (FDTD) method to model electromagnetic field distribution incomplex pattern-film geometry. Within FDTD, we solve Maxwell equations numerically, which enables us to model any type of geometry or material properties. Therefore, the effects of different perturbations, like pattern boundary imperfections or thin filmroughness can be studied within this method, showing their effect on the electromagnetic field distribution within illuminated chalcogenide thin film.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/FT-TA3%2F142" target="_blank" >FT-TA3/142: Analysis of the optical properties of solar cells.</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2007

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Physics and Chemistry of Solids

  • ISSN

    0022-3697

  • e-ISSN

  • Volume of the periodical

    68

  • Issue of the periodical within the volume

    5-6

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    4

  • Pages from-to

  • UT code for WoS article

  • EID of the result in the Scopus database