Utilization of synchrotron radiation for in-situ diffusion studies
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F08%3A00027765" target="_blank" >RIV/00216224:14310/08:00027765 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Utilization of synchrotron radiation for in-situ diffusion studies
Original language description
We have investigated SiGe/Si and SiGe/Ge multilayers annealed in-situ at temperatures in the range 680-800 C by x-ray diffraction.
Czech name
—
Czech description
—
Classification
Type
O - Miscellaneous
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
—
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů