X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F11%3A00054738" target="_blank" >RIV/00216224:14310/11:00054738 - isvavai.cz</a>

Result on the web

<a href="http://scripts.iucr.org/cgi-bin/paper?S0021889811001439" target="_blank" >http://scripts.iucr.org/cgi-bin/paper?S0021889811001439</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1107/S0021889811001439" target="_blank" >10.1107/S0021889811001439</a>

Result language

angličtina

Original language name

X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions

Original language description

The width and integrated intensity of the 220 X-ray double-diffraction profile and the shift of the Bragg condition due to refraction have been measured in a channel-cut Ge crystal in an angular range near the critical angle of total external reflection.The Bragg angle and incidence condition were varied by changing the X-ray energy. In agreement with the extended dynamical theory of X-ray diffraction, the integrated intensity of the double diffraction remained almost constant, even for the grazing-incidence condition very close to the critical angle for total external reflection. A broadening of the diffraction profile not predicted by the extended theory of X-ray diffraction was observed when the Bragg condition was at angles of incidence lower than0.6 deg. Plane wave topographs revealed a contrast that could be explained by a slight residual crystal surface undulation of 0.3 deg due to etching to remove the cutting damage and the increasing effect of refraction at small glancing a

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2011

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Applied Crystallography

ISSN

0021-8898

e-ISSN

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Volume of the periodical

44

Issue of the periodical within the volume

44

Country of publishing house

GB - UNITED KINGDOM

Number of pages

6

Pages from-to

353-358

UT code for WoS article

000288758500012

EID of the result in the Scopus database

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