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Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F14%3A00073316" target="_blank" >RIV/00216224:14310/14:00073316 - isvavai.cz</a>

  • Result on the web

    <a href="http://ac.els-cdn.com/S0040609014002533/1-s2.0-S0040609014002533-main.pdf?_tid=1164e0f6-cca0-11e4-ac1b-00000aab0f01&acdnat=1426595038_4b3a79a484100725154217605bb36278" target="_blank" >http://ac.els-cdn.com/S0040609014002533/1-s2.0-S0040609014002533-main.pdf?_tid=1164e0f6-cca0-11e4-ac1b-00000aab0f01&acdnat=1426595038_4b3a79a484100725154217605bb36278</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.tsf.2014.02.092" target="_blank" >10.1016/j.tsf.2014.02.092</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces

  • Original language description

    Expressions for ellipsometric quantities and reflectance presented are based on a heuristic combination of the Rayleigh-Rice theory and the scalar diffraction theory. The latter takes into account the local slopes and shadowing. The second-order Rayleigh-Rice theory is used to express the local electric field on the rough surface and the obtained expressions are then used in the scalar diffraction theory instead of the expressions corresponding to a smooth surface. A numeric method of evaluation of thequadruple integral resulting from this combination of the two theories is developed, utilising a Gauss-like quadrature. The efficiency of the formulae is illustrated by optical characterisation of rough silicon and gallium arsenide surfaces created usinganodic and thermal oxidation, respectively, and covered with native oxide layers. The optical characterisation employs variable-angle spectroscopic ellipsometry and spectroscopic reflectometry. (C) 2014 Elsevier B.V. All rights reserved.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Thin Solid Films

  • ISSN

    0040-6090

  • e-ISSN

  • Volume of the periodical

    571

  • Issue of the periodical within the volume

    November

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    6

  • Pages from-to

    695-700

  • UT code for WoS article

    000346055200068

  • EID of the result in the Scopus database