Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F18%3A00104688" target="_blank" >RIV/00216224:14310/18:00104688 - isvavai.cz</a>
Result on the web
<a href="https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3" target="_blank" >https://link.springer.com/chapter/10.1007/978-3-319-75325-6_3</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/978-3-319-75325-6_3" target="_blank" >10.1007/978-3-319-75325-6_3</a>
Alternative languages
Result language
angličtina
Original language name
Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
Original language description
The universal dispersion model is a collection of dispersion models (contributions to the dielectric response) describing individual elementary excitation in solids. All contributions presented in this chapter satisfy the basic conditions that follow from the theory of dispersion (time reversal symmetry, Kramers--Kronig consistency and finite sum rule integral). The individual contributions are presented in an unified formalism. In this formalism the spectral distributions of the contributions are parameterized using dispersion functions normalized with respect to the sum rule. These normalized dispersion functions must be multiplied by the transition strengths parameters which can be related to the density of charged particles. The separation of contributions into the transitions strengths and normalized spectral distributions is beneficial since it allows us to elegantly introduce the temperature dependencies into these models.
Czech name
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Czech description
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Classification
Type
C - Chapter in a specialist book
CEP classification
—
OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
<a href="/en/project/LO1411" target="_blank" >LO1411: Development of Centre for low-cost plasma and nanotechnology surface modification</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Book/collection name
Optical Characterization of Thin Solid Films
ISBN
9783319753249
Number of pages of the result
52
Pages from-to
31-82
Number of pages of the book
462
Publisher name
Springer
Place of publication
Cham
UT code for WoS chapter
000441388800005