All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F20%3A00114443" target="_blank" >RIV/00216224:14310/20:00114443 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1364/OE.380657" target="_blank" >https://doi.org/10.1364/OE.380657</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1364/OE.380657" target="_blank" >10.1364/OE.380657</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials

  • Original language description

    A common approach to non-uniformity is to assume that the local thicknesses inside the light spot are distributed according to a certain distribution, such as the uniform distribution or the Wigner semicircle distribution. A model considered in this work uses a different approach in which the local thicknesses are given by a polynomial in the coordinates x and y along the surface of the film. An approach using the Gaussian quadrature is very efficient for including the influence of the non-uniformity on the measured ellipsometric quantities. However, the nodes and weights for the Gaussian quadrature must be calculated numerically if the non-uniformity is parameterized by the second or higher degree polynomial. A method for calculating these nodes and weights which is both efficient and numerically stable is presented. The presented method with a model using a second-degree polynomial is demonstrated on the sample of highly non-uniform polymer-like thin film characterized using variable-angle spectroscopic ellipsometry. The results are compared with those obtained using a model assuming the Wigner semicircle distribution.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10306 - Optics (including laser optics and quantum optics)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Optics Express

  • ISSN

    1094-4087

  • e-ISSN

    1094-4087

  • Volume of the periodical

    28

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    15

  • Pages from-to

    5492-5506

  • UT code for WoS article

    000514575500095

  • EID of the result in the Scopus database

    2-s2.0-85079359313