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Optical Characterization of Inhomogeneous Thin Films Deposited onto Non-Absorbing Substrates

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F23%3A00130859" target="_blank" >RIV/00216224:14310/23:00130859 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.mdpi.com/2079-6412/13/5/873" target="_blank" >https://www.mdpi.com/2079-6412/13/5/873</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.3390/coatings13050873" target="_blank" >10.3390/coatings13050873</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Optical Characterization of Inhomogeneous Thin Films Deposited onto Non-Absorbing Substrates

  • Original language description

    In this study, a novel approach for characterizing the optical properties of inhomogeneous thin films is presented, with a particular focus on samples exhibiting absorption in some part of the measured spectral range. Conventional methods of measuring the samples only from the film side can be limited by incomplete information at the lower boundary of the film, leading to potentially unreliable results. To address this issue, depositing the thin films onto non-absorbing substrates to enable measurements from both sides of the sample is proposed. To demonstrate the efficacy of this approach, a combination of variable-angle spectroscopic ellipsometry and spectrophotometry at near-normal incidence was employed to optically characterize three inhomogeneous polymer-like thin films. The spectral dependencies of the optical constants were modeled using the Kramers–Kronig consistent model. It was found that it is necessary to consider thin, weakly absorbing transition layers between the films and the substrates. The obtained results show excellent agreement between the fits and the measured data, providing validation of the structural and dispersion models, as well as the overall characterization procedure. The proposed approach offers a method for optically characterizing a diverse range of inhomogeneous thin films, providing more reliable results when compared to traditional one-sided measurements.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20501 - Materials engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2023

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Coatings

  • ISSN

    2079-6412

  • e-ISSN

    2079-6412

  • Volume of the periodical

    13

  • Issue of the periodical within the volume

    5

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    16

  • Pages from-to

    1-16

  • UT code for WoS article

    000997253700001

  • EID of the result in the Scopus database

    2-s2.0-85160402607