X-ray diffraction from quantum wires and quantum dots
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F99%3A00000037" target="_blank" >RIV/00216224:14310/99:00000037 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
X-ray diffraction from quantum wires and quantum dots
Original language description
N/A
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F97%2F0003" target="_blank" >GA202/97/0003: The morfology of the interfaces in heteroepitaxial multilayers</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
1999
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Materials Science: Materials in Electronics
ISSN
0957-4522
e-ISSN
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Volume of the periodical
(10)1999
Issue of the periodical within the volume
-
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
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UT code for WoS article
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EID of the result in the Scopus database
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