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Crystallization in Se-Te thin films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F12%3A39895996" target="_blank" >RIV/00216275:25310/12:39895996 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Crystallization in Se-Te thin films

  • Original language description

    Crystallization process in Se100-xTex thin films (x = 10, 20) was studied by direct observation of crystal growth by using scanning electron microscopy (SEM) and in-situ X-ray diffraction (XRD). The experimental data were analyzed and described by 2D surface-nucleated model and conventional Johnson-Mehl-Avrami model.

  • Czech name

  • Czech description

Classification

  • Type

    O - Miscellaneous

  • CEP classification

    CF - Physical chemistry and theoretical chemistry

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/EE2.3.09.0104" target="_blank" >EE2.3.09.0104: Education and Development of Research Team for Centre of Material Science Pardubice</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů