Crystallization in Se-Te thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F12%3A39895996" target="_blank" >RIV/00216275:25310/12:39895996 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Crystallization in Se-Te thin films
Original language description
Crystallization process in Se100-xTex thin films (x = 10, 20) was studied by direct observation of crystal growth by using scanning electron microscopy (SEM) and in-situ X-ray diffraction (XRD). The experimental data were analyzed and described by 2D surface-nucleated model and conventional Johnson-Mehl-Avrami model.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
CF - Physical chemistry and theoretical chemistry
OECD FORD branch
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Result continuities
Project
<a href="/en/project/EE2.3.09.0104" target="_blank" >EE2.3.09.0104: Education and Development of Research Team for Centre of Material Science Pardubice</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů