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Sub-micrometer soft lithography of a bulk chalcogenide glass

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F13%3A39896426" target="_blank" >RIV/00216275:25310/13:39896426 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-21-8-9584" target="_blank" >http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-21-8-9584</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1364/OE.21.009584" target="_blank" >10.1364/OE.21.009584</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Sub-micrometer soft lithography of a bulk chalcogenide glass

  • Original language description

    We demonstrate, for the first time, time-and cost-effective replication of sub-micrometer features from a soft PDMS mold onto a bulk chalcogenide glass over a large surface area. A periodic array of submicrometer lines (diffraction grating) with period 625 nm, amplitude 45 nm and surface roughness 3 nm was imprinted onto the surface of the chalcogenide AsSe2 bulk glass at temperature 225 degrees C, i.e. 5 degrees C below the softening point of the glass. Sub-micrometer soft lithography into chalcogenidebulk glasses shows good reliability, reproducibility and promise for feasible fabrication of various dispersive optical elements, antireflection surfaces, 2D photonic structures and nano-structured surfaces for enhanced photonic properties and chemicalsensing. (C) 2013 Optical Society of America

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    CA - Inorganic chemistry

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/EE2.3.20.0254" target="_blank" >EE2.3.20.0254: Research Team for Advanced Non-crystalline Materials</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Optics Express

  • ISSN

    1094-4087

  • e-ISSN

  • Volume of the periodical

    21

  • Issue of the periodical within the volume

    8

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    8

  • Pages from-to

    9584-9591

  • UT code for WoS article

    000318151600040

  • EID of the result in the Scopus database