Crystallization behavior in Se90Te10 and Se80Te20 thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F14%3A39898147" target="_blank" >RIV/00216275:25310/14:39898147 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.4869547" target="_blank" >http://dx.doi.org/10.1063/1.4869547</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.4869547" target="_blank" >10.1063/1.4869547</a>
Alternative languages
Result language
angličtina
Original language name
Crystallization behavior in Se90Te10 and Se80Te20 thin films
Original language description
Isothermal crystal growth kinetics in Se90Te10 and Se80Te20 thin films was studied by microscopy and in situ X-ray diffraction (XRD) measurements. The spherulite-like crystals grew linearly with time. In a narrow temperature range of between 65 and 85 degrees C, crystal growth rates exhibit simple exponential behavior with activation energies E-G = 193 +/- 4 kJ mol(-1) for Se90Te10 and E-G = 195 +/- 4 kJ mol(-1) for Se80Te20. The crystal growth in both compositions is controlled by liquid-crystal interface kinetics and can be described by a screw dislocation growth model. From the XRD data, the crystallization fraction was estimated. The crystallization data were described by Johnson-Mehl-Avrami (JMA) model with Avrami exponents m = 1.4 +/- 0.3 for Se90Te10 and m = 1.6 +/- 0.4 for Se80Te20. Activation energies were estimated from the temperature dependence of rate constant evaluated from the JMA model. The activation energies of nucleation-growth process were found to be E-c = 184 +/-
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
CF - Physical chemistry and theoretical chemistry
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP106%2F11%2F1152" target="_blank" >GAP106/11/1152: Reversible crystallization and structural relaxation in amorphous materials used for phase change recording</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Applied Physics
ISSN
0021-8979
e-ISSN
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Volume of the periodical
115
Issue of the periodical within the volume
12
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
"123506-1"-"123506-7"
UT code for WoS article
000333901100015
EID of the result in the Scopus database
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