Crystallization kinetics of Se-Te thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F14%3A39898713" target="_blank" >RIV/00216275:25310/14:39898713 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.tsf.2014.10.005" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2014.10.005</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.tsf.2014.10.005" target="_blank" >10.1016/j.tsf.2014.10.005</a>
Alternative languages
Result language
angličtina
Original language name
Crystallization kinetics of Se-Te thin films
Original language description
Differential scanning calorimetry was used to study the non-isothermal crystallization behavior of selenium-tellurium thin films within the 0-30 at.% Te compositional range. The non-isothermal crystallization kinetics were described in terms of the Johnson-Mehl-Avrami nucleation-growth model. The apparent activation energy of crystallization was found to exhibit a step-like compositional behavior, with E changing from similar to 115 to similar to 145 kJ.mol(-1) in the 10-15 at.% Te range. Two-dimensional growth of crystallites, consistent with the idea of sterically restricted crystallization in a thin layer, was confirmed for all data. However, in the case of the Se70Te30 thin film, indications of three-dimensional crystal growth were found at high heating rates. This corresponds to the previously reported behavior of Se-Te chalcogenide matrices, where the addition of tellurium leads to the formation of smaller, volume-located crystallites.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
CF - Physical chemistry and theoretical chemistry
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Thin Solid Films
ISSN
0040-6090
e-ISSN
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Volume of the periodical
571
Issue of the periodical within the volume
November
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
6
Pages from-to
121-126
UT code for WoS article
000346053900020
EID of the result in the Scopus database
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